This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Snap Inc.. Active years: 2025.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2025
Title: Meena De Schutter: Innovator in Image Quality Assessment
Introduction
Meena De Schutter is a prominent inventor based in Santa Monica, CA. She has made significant contributions to the field of image quality assessment, showcasing her expertise through her innovative patent.
Latest Patents
Meena holds a patent for "Image visual quality assessment systems and methods." This patent describes a method of image quality assessment performed by one or more processors in an image capture device. The method involves receiving notification of the capture of an image and, in response, initiating an image assessment task to evaluate the quality of the image. The assessment task includes determining the suitability of the image for quality assessment, running an image quality assessment model on the image to generate results, collecting data related to the image capture, and transmitting the results to an image quality assessment repository. Notably, the image assessment task may be a lower priority asynchronous task. Meena has 1 patent to her name.
Career Highlights
Meena is currently employed at Snap Inc., where she continues to develop and refine her innovative ideas in image processing and quality assessment. Her work has positioned her as a key player in the technology sector, particularly in enhancing the quality of images captured by devices.
Collaborations
Some of her notable coworkers include Bo Feng and Ruogu Zeng, who contribute to the collaborative environment at Snap Inc.
Conclusion
Meena De Schutter's contributions to image quality assessment reflect her innovative spirit and dedication to advancing technology. Her work at Snap Inc. and her patent demonstrate her commitment to improving image processing methods.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
