The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 16, 2025
Filed:
Apr. 21, 2022
Snap Inc., Santa Monica, CA (US);
Meena De Schutter, Santa Monica, CA (US);
Bo Feng, Los Angeles, CA (US);
Ruogu Zeng, Los Angeles, CA (US);
Anbang Zhao, Seattle, WA (US);
Snap Inc., Santa Monica, CA (US);
Abstract
A method of image quality assessment, performed by one or more processors in an image capture device, is disclosed. The method comprising receiving notification of capture of an image and in response, initiating an image assessment task to assess the quality of the image. The assessment task comprises determining suitability of the image for image quality assessment, running an image quality assessment model on the image to generate image quality assessment results, collecting data related to the capture of the image, and transmitting the results to an image quality assessment repository. The image assessment task may be a lower priority asynchronous task.