This inventor holds 1 USPTO granted patent. Top assignee: USA as Represented by Secretary of the Navy. Active years: 1985.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1985
Title: Max L Moffitt: Innovator in Optical Surface Measurement
Introduction
Max L Moffitt is a notable inventor based in Ridgecrest, CA (US). He has made significant contributions to the field of optical surface measurement, particularly with his innovative patent that addresses the challenges associated with aspheric surfaces. His work is recognized for its practical applications in various optical technologies.
Latest Patents
Max L Moffitt holds a patent for the "Asperic Surface Test Fixture." This optic surface apparatus is designed to handle aspheric surfaces by utilizing direct measurement of the blur circle of the image created by the test surface. The device employs a collimated light beam that includes the test surface in its optical path, directing it to an ultimate focal point. An apertured screen with varying diameter apertures is positioned at the focal point, allowing a light detector to measure the intensity of light based on aperture size. The design incorporates a folding mirror to maintain a compact physical structure, and it can accommodate different wavelengths of test energy with appropriate adjustments.
Career Highlights
Max L Moffitt is currently associated with the United States Navy, where he contributes his expertise in optical technologies. His work has been instrumental in advancing the capabilities of optical measurement devices, enhancing their accuracy and efficiency.
Collaborations
Throughout his career, Max has collaborated with notable colleagues such as Steven A Sievert and Eugene C Foust. These partnerships have fostered innovation and have led to advancements in the field of optical measurement.
Conclusion
Max L Moffitt's contributions to optical surface measurement through his patent demonstrate his commitment to innovation in the field. His work continues to influence the development of optical technologies, showcasing the importance of precise measurement in various applications.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile