The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 18, 1985
Filed:
Mar. 18, 1983
Edwin M Allen, Ridgecrest, CA (US);
Eugene C Foust, Ridgecrest, CA (US);
Steven A Sievert, Ridgecrest, CA (US);
William C Fitzgerald, Ridgecrest, CA (US);
Max L Moffitt, Ridgecrest, CA (US);
The United States of America as represented by the Secretary of the Navy, Washington, DC (US);
Abstract
An optic surface apparatus capable of handling aspheric surfaces uses dir measurement of the blur circle of the image created by the test surface. Direct measurement of the blur circle is obtained by providing a collimated light beam which includes the test surface in its optical path to an ultimate focal point. The focal point is occupied by an apertured screen with apertures of varying diameter. A light detector is placed behind the apertured screen to measure the intensity of light as a function of aperture size. The apertured screen and detector are mounted on a three-axis translator. For apertures less than the effective diameter of the blur circle, less than 100% light is received by the detector. For apertures equal to or greater than the effective diameter of the blur circle, 100% of the light reaches the light detector. A folding mirror is used in the optical path to permit the device to be physically compact. Different wavelengths of test energy may be employed provided that appropriate adjustments are made to the corrector lens and detector choice.