This inventor holds 1 USPTO granted patent. Top assignee: Massachusetts Institute of Technology. Active years: 1990.
Company Filing History:
Years Active: 1990
Title: Max J Kennedy: Innovator in Solid Particle Measurement
Introduction
Max J Kennedy is a notable inventor based in Cambridge, MA. He has made significant contributions to the field of solid particle measurement, particularly in the context of cell culture. His innovative approach has led to the development of a unique method for determining the concentration of solid particles in various samples.
Latest Patents
Max J Kennedy holds a patent for the invention titled "Measurement of solid particle concentration in presence of a second." This invention pertains to a method and an apparatus for determining the concentration of solid particles of interest in a sample that contains at least one other type of solid particle. The method involves measuring light scatter at a wavelength that is independent of the concentration of the solid particles that are not of interest. This technique is particularly useful for measuring solid particles of interest, such as cells grown in cell culture medium that comprises a solid substrate. He has 1 patent to his name.
Career Highlights
Max J Kennedy is affiliated with the Massachusetts Institute of Technology, where he continues to engage in research and innovation. His work has been instrumental in advancing the methodologies used in particle concentration measurement, which has implications in various scientific fields.
Collaborations
Throughout his career, Max has collaborated with esteemed colleagues, including Gregory N Stephanopoulos and Daniel I Wang. These collaborations have further enriched his research and contributed to the development of innovative solutions in his field.
Conclusion
Max J Kennedy's contributions to the measurement of solid particle concentration highlight his role as an influential inventor. His work not only advances scientific understanding but also paves the way for future innovations in the field.
