The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 13, 1990
Filed:
Jul. 21, 1989
Applicant:
Inventors:
Max J Kennedy, Cambridge, MA (US);
Daniel I Wang, Belmont, MA (US);
Gregory N Stephanopoulos, Winchester, MA (US);
Assignee:
Massachusetts Institute of Technology, Cambridge, MA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ;
U.S. Cl.
CPC ...
356338 ; 356335 ; 356301 ;
Abstract
This invention pertains to a method and an apparatus for determining concentration of solid particles of interest in a sample in the presence of at least one other type of solid particle by measuring light scatter at a wavelength which is independent of solid particle concentration which is not of interest and related to solid particle concentration of interest. Preferably, solid particles of interest are cells grown in cell culture medium comprising a solid substrate.