Maurice R Barr

Title: Innovations by Maurice R Barr

Introduction

Maurice R Barr is a notable inventor based in Saratoga, CA (US). He has made significant contributions to the field of high-speed testing systems for semiconductor integrated circuits. With a total of 2 patents, his work has advanced the capabilities of electronic testing technologies.

Latest Patents

One of his latest patents is an "Ultra-high-speed digital test system using electro-optic signal sampling." This innovative system utilizes electro-optic sampling techniques to perform tests at data rates up to 1.2 Gb/s. The receiver portion of the tester boasts a 4.5 GHz bandwidth and can conduct ECL level functional tests with one sampling pulse per vector. The design includes a test head with an electro-optic birefringent crystal sensor positioned below the device under test, minimizing signal path length. The system control unit features a Nd: YAG modelocked laser that generates optical pulses, which are directed to an array of reflective contacts on the sensor. The sensor operates as a Pockels cell, with the electric field in the crystal sensor changing the transmission of polarized light based on the voltages on the array of contacts. Reflected pulses are then received and converted into electrical signals that indicate the voltages on the electro-optic sensor.

Another significant patent is the "High frequency test head using electro-optics." This high-speed test system is designed for testing various electrical devices, including integrated circuits and semiconductor wafers, at device operating speeds in the Gigahertz range. The test head features a test platform that accommodates an adapter board holding the device under test. The platform is easily accessible for changing tested devices and coupling with conventional wafer prober machines. A series of pin driver boards are arranged radially around the test platform to minimize the distance between the device under test and the pin driver boards. Electrical signals at specific locations on the device are measured in response to input signals from the pin drivers, utilizing an electro-optic sensor located centrally within 1.0 cm of the device to reduce pin capacitance. Additionally, a cooling system maintains the pin drivers at a constant temperature during operation to minimize timing drift.

Career Highlights

Maurice R Barr has been instrumental in the development of advanced testing systems at Photon Dynamics, Inc. His innovative approaches have significantly enhanced the efficiency and accuracy of electronic testing.

Collaborations

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