Location History:
- Heubach, DE (2013)
- Heubach-Lautern, DE (2013 - 2017)
Company Filing History:
Years Active: 2013-2017
Title: Matthias Langer: Innovator in Charged Particle Technology
Introduction
Matthias Langer is a notable inventor based in Heubach-Lautern, Germany. He has made significant contributions to the field of microscopy and charged particle technology. With a total of 3 patents to his name, Langer's work has advanced the capabilities of imaging techniques.
Latest Patents
Langer's latest patents include a method for avoiding artifacts during serial block face imaging. This innovative method involves capturing a first image of a sample using a detector, where the primary particle beam's particles have a first average energy. This allows the interaction products detected to predominantly contain sample information from a layer below the sample surface. The method also entails removing the outermost sample layer with a cutting device and capturing a second image, where the particles have a second average energy, focusing on the surface layer of the sample. Furthermore, the method calculates the lateral shift of the sample by comparing the first and second images and compensates for any lateral offset.
Another significant patent is for a charged particle source. This invention comprises at least one gas inlet for supplying gas particles, a tip biased to create an electrical field for generating charged particles, and an ionization area where gas particles are ionized due to the electrical field. The charged particle source also includes electrodes to accelerate charged particles and a light-emitting device that focuses a light beam in the ionization area, enhancing the efficiency of the ionization process.
Career Highlights
Matthias Langer is currently employed at Carl Zeiss Microscopy GmbH, a leading company in the field of optical and electron microscopy. His work at this esteemed organization has allowed him to push the boundaries of microscopy technology and contribute to advancements in scientific research.
Collaborations
Langer has collaborated with notable colleagues such as Gerd Ludwig Benner and Wolfram Buhler. These collaborations have fostered innovation and have been instrumental in the development of new technologies in microscopy.
Conclusion
Matthias Langer's contributions to the field of charged particle technology and microscopy are noteworthy. His innovative patents and work at Carl Zeiss Microscopy GmbH highlight his role as a leading inventor in this domain. His ongoing efforts continue to shape the future of imaging technologies.