Matthias Hoeh

Title: Matthias Hoeh - Innovator in Spectroradiometry

Introduction

Matthias Hoeh is a notable inventor based in Munich, Germany. He has made significant contributions to the field of optical measurement technology, particularly in the area of spectroradiometry. His innovative approach addresses critical challenges in monitoring light-emitting test objects.

Latest Patents

Matthias Hoeh holds a patent for a "Method and apparatus for monitoring a spectral radiometer." This invention focuses on a method for monitoring a spectroradiometer, specifically for measuring light-emitting test objects. The invention captures the spectral data of these test objects through an optical system, allowing for the determination of radiometric, photometric, and colorimetric quantities. The primary challenge addressed by this invention is the need for a method that emphasizes monitoring when calibration is necessary, rather than continuous recalibration. The solution involves detecting changes in the wavelength scale, light throughput, and spectral sensitivity using a reference light source integrated into the optical system.

Career Highlights

Matthias Hoeh is associated with Instrument Systems Optische Messtechnik GmbH, where he applies his expertise in optical measurement technology. His work has led to advancements in the accuracy and reliability of spectroradiometric measurements.

Collaborations

Matthias has collaborated with notable colleagues, including Reto Haring and Florian Schewe, contributing to the development of innovative solutions in the field.

Conclusion

Matthias Hoeh's contributions to spectroradiometry exemplify the importance of innovation in optical measurement technology. His patent addresses critical monitoring challenges, showcasing his commitment to advancing the field.