Instrument Systems Optische Messtechnik Gmbh

Matthias Hoeh

Reto Haring

Florian Schewe

Martin Mangstl

Thorsten Kopp

The invention relates to a method for monitoring a spectroradiometer (), in particular for measuring light-emitting test objects (), in which the spectral data of the test objects () are captured by means of an optical system, wherein the radiometric, photometric and/or colorimetric quantities of the test objects () are ascertained from the spectral data. The problem addressed by the invention is that of specifying a method for monitoring a spectroradiometer (), where it is not the continuous recalibration of the spectroradiometer () but the monitoring of when a calibration is necessary that is paramount. The invention solves this problem by virtue of changes in the wavelength scale, in the light throughput and/or in the spectral sensitivity of the spectroradiometer () being detected by way of a reference light source (), integrated into the optical system, with a defined spectrum. Optionally, at least one detector integrated into the optical system can additionally monitor the stability of the reference light source (). Moreover, the invention relates to a device for carrying out the method.

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Munich, Germany

Matthias Hoeh