The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 07, 2023
Filed:
Aug. 09, 2019
Instrument Systems Optische Messtechnik Gmbh, Munich, DE;
Matthias Hoeh, Munich, DE;
Reto Haring, Munich, DE;
Florian Schewe, Munich, DE;
Martin Mangstl, Munich, DE;
Thorsten Kopp, Neubiberg, DE;
Instrument Systems Optische Messtechnik GmbH, Munich, DE;
Abstract
The invention relates to a method for monitoring a spectroradiometer (), in particular for measuring light-emitting test objects (), in which the spectral data of the test objects () are captured by means of an optical system, wherein the radiometric, photometric and/or colorimetric quantities of the test objects () are ascertained from the spectral data. The problem addressed by the invention is that of specifying a method for monitoring a spectroradiometer (), where it is not the continuous recalibration of the spectroradiometer () but the monitoring of when a calibration is necessary that is paramount. The invention solves this problem by virtue of changes in the wavelength scale, in the light throughput and/or in the spectral sensitivity of the spectroradiometer () being detected by way of a reference light source (), integrated into the optical system, with a defined spectrum. Optionally, at least one detector integrated into the optical system can additionally monitor the stability of the reference light source (). Moreover, the invention relates to a device for carrying out the method.