Takasaki, Japan

Matsuura Nobuyoshi

This inventor holds 1 USPTO granted patent. Top assignee: Renesas Electronics America Inc.. Active years: 2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Matsuura Nobuyoshi. Retrieved from https://idiyas.com/inventor/matsuura-nobuyoshi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2012

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1 patent (USPTO):Explore Patents

Title: Matsuura Nobuyoshi: Innovator in Current Sensing Technology

Introduction

Matsuura Nobuyoshi is a notable inventor based in Takasaki, Japan. He has made significant contributions to the field of electrical engineering, particularly in current sensing technology. His innovative approach has led to the development of a unique patent that enhances the efficiency of current measurement.

Latest Patents

Matsuura holds a patent for a "Current sensing and measuring method and apparatus." This method involves obtaining a voltage across a first transistor and multiplying it by a predetermined multiple to yield a multiplied voltage. The multiplied voltage is then applied to a second transistor, which is smaller than the first. This innovative method provides an output current of the second transistor as a scaled estimate of the output current of the first transistor.

Career Highlights

Matsuura Nobuyoshi is currently employed at Renesas Electronics America Inc., where he continues to work on advancing technology in the electronics sector. His expertise in current sensing has positioned him as a valuable asset to his team and the company.

Collaborations

Matsuura collaborates with talented coworkers, including Tetsuo Sato and Ryotaro Kudo. Their combined efforts contribute to the innovative projects at Renesas Electronics America Inc.

Conclusion

Matsuura Nobuyoshi's contributions to current sensing technology exemplify the impact of innovation in the electronics industry. His patent reflects a significant advancement in the field, showcasing his dedication to improving measurement methods.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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