Company Filing History:
Years Active: 2009-2012
Title: Innovations by Mats Gokstorp
Introduction
Mats Gokstorp is an accomplished inventor based in Vreta Kloster, Sweden. He has made significant contributions to the field of imaging technology, holding two patents that showcase his innovative approach to measuring and analyzing the characteristics of objects.
Latest Patents
Gokstorp's latest patents include a "Measuring apparatus and method for range inspection." This invention relates to an imaging apparatus designed to measure the three-dimensional characteristics of an object through range data acquisition and analysis. The apparatus features several components, including means for configuring range data acquisition, creating images from reflected light, acquiring range data, calibrating it to world-coordinates, rectifying the data onto a uniform grid, and analyzing the data to obtain three-dimensional characteristics.
Another notable patent is the "System and method of imaging the characteristics of an object." This system involves illuminating an object with incident light and detecting the reflected light using an imaging sensor. The detected light is converted into electrical charges, creating a representation of the object. Information on light scattered in different layers of the object is obtained and compared to stored information to detect any defects.
Career Highlights
Mats Gokstorp is currently employed at Sick IVP AB, where he continues to develop innovative solutions in imaging technology. His work has contributed to advancements in the field, particularly in the area of range inspection and defect detection.
Collaborations
Gokstorp collaborates with talented individuals such as Mattias Johannesson and Henrik Turbell, who contribute to the innovative projects at Sick IVP AB.
Conclusion
Mats Gokstorp's contributions to imaging technology through his patents demonstrate his expertise and commitment to innovation. His work continues to influence the field, paving the way for future advancements in object measurement and analysis.