The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 16, 2012
Filed:
Jun. 13, 2005
Henrik Turbell, Linkoeping, SE;
Mats Gokstorp, Vreta Kloster, SE;
Henrik Turbell, Linkoeping, SE;
Mats Gokstorp, Vreta Kloster, SE;
Sick IVP AB, Linkoping, SE;
Abstract
The present invention relates to an imaging apparatus and method for measuring the three-dimensional characteristics of an object using range data acquisition and analysis. The imaging apparatus comprises: means for configuring the range data acquisition and analysis before starting the measuring; means for creating an image of the object by detecting reflected light from the object using at least one sensor comprising pixels; means for acquiring range data of the object from the created image measured in sensor pixel units; means for calibrating the acquired range data from sensor pixel values to world-coordinates; means for rectifying the calibrated range data by re-sampling the range data onto a uniformly spaced grid; and, means for analyzing the calibrated and rectified range data in order to obtain the three-dimensional characteristics of the object.