Lausanne, Switzerland

Mathieu Ducros

This inventor holds 1 USPTO granted patent. Top assignee: Ecole Polytechnique Federale De Lausanne. Active years: 2008.


Average Co-Inventor Count = 7.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2008

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1 patent (USPTO):Explore Patents

Title: The Innovations of Mathieu Ducros

Introduction

Mathieu Ducros is a notable inventor based in Lausanne, Switzerland. He has made significant contributions to the field of microscopy through his innovative approaches and methods. His work is characterized by a focus on enhancing imaging techniques, which are crucial for various scientific applications.

Latest Patents

Mathieu Ducros holds a patent for a "Microscopy imaging apparatus and method for generating an image." This invention provides a method and apparatus for generating an optically sectioned image of a specimen. The method involves illuminating the specimen with a modulating, spatially periodic illumination pattern, imaging the specimen on a conjugate image plane, and acquiring signals that correspond to the incident light intensity. By measuring the characteristics of the oscillatory components of these signals, Ducros's method allows for the generation of detailed images of specimens.

Career Highlights

Ducros is affiliated with the École Polytechnique Fédérale de Lausanne, where he has been involved in cutting-edge research and development in microscopy. His work has not only advanced the field but has also paved the way for further innovations in imaging technologies.

Collaborations

Mathieu Ducros has collaborated with esteemed colleagues such as Stéphane Bourquin and Theo Lasser. These collaborations have contributed to the success of his projects and have fostered a rich environment for innovation.

Conclusion

Mathieu Ducros exemplifies the spirit of innovation in the field of microscopy. His patented methods and collaborative efforts continue to influence the scientific community and enhance imaging techniques.

Profile summary based on public USPTO records.
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