The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 10, 2008
Filed:
Jan. 15, 2003
Karsten Plamann, Lausanne, CH;
Stéphane Bourquin, Lausanne, CH;
Mathieu Ducros, Lausanne, CH;
Jelena Mitic, Lausanne, CH;
Francois Vuille, Lausanne, CH;
Theo Lasser, Lausanna, CH;
Tiemo Anhut, Lausanne, CH;
Karsten Plamann, Lausanne, CH;
Stéphane Bourquin, Lausanne, CH;
Mathieu Ducros, Lausanne, CH;
Jelena Mitic, Lausanne, CH;
Francois Vuille, Lausanne, CH;
Theo Lasser, Lausanna, CH;
Tiemo Anhut, Lausanne, CH;
Ecole Polytechnique Federale de Lausanne, Lausanne, CH;
Abstract
A method and a microscopy imaging apparatus for generating an optically sectioned image of a specimen are provided. The method comprises the steps of: illuminating the specimen with a modulating, spatially periodic illumination pattern; imaging said specimen on a conjugate image plane; acquiring a plurality of signals at respective positions on said image plane, each signal corresponding to the incident light intensity at that position and having an oscillatory component caused by the modulation of the illumination pattern; and measuring a characteristic of the oscillatory component of each of the signals, whereby the measured characteristics when combined in their relative positions generate an optically sectioned image of the specimen.