Mathias N Muris

Title: Mathias N Muris: Innovator in Integrated Circuit Testing

Introduction

Mathias N Muris is a notable inventor based in Eindhoven, Netherlands. He has made significant contributions to the field of integrated circuit testing, holding a total of 5 patents. His work focuses on improving the efficiency and effectiveness of testing methods for integrated circuits.

Latest Patents

Muris's latest patents include an apparatus for testing a fixed logic value interconnection between integrated circuits. This device features a first integrated circuit and a second integrated circuit that applies a fixed logic value to the input of the first IC. Traditional implementations require pull-up and pull-down resistors, which add complexity to the testing process. Muris's innovation allows the output of the second IC to be controlled via test logic during testing, enabling a streamlined approach to testing interconnections. Another significant patent is a tester arrangement comprising a connection module for testing using the Boundary Scan Test method. This arrangement allows for the testing of carriers with both BST logic and non-BST logic ICs, ensuring compatibility and efficiency in testing.

Career Highlights

Mathias N Muris is associated with U.S. Philips Corporation, where he has contributed to various projects aimed at enhancing integrated circuit technology. His work has been instrumental in advancing testing methodologies that are crucial for the reliability of electronic devices.

Collaborations

Muris has collaborated with notable colleagues such as Lars A Eerenstein and Franciscus G De Jong. These partnerships have fostered innovation and have led to the development of advanced testing solutions in the field of integrated circuits.

Conclusion

Mathias N Muris is a distinguished inventor whose work in integrated circuit testing has paved the way for more efficient testing methods. His contributions continue to impact the electronics industry positively.