Livermore, CA, United States of America

Mateusz Monterial

This inventor holds 2 USPTO granted patents and 1 published patent application. Top assignee: Gm Cruise Holdings LLC. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Mateusz Monterial. Retrieved from https://idiyas.com/inventor/mateusz-monterial

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 2 

Average Co-Inventor Count = 7.0

ph-index = 1


Company Filing History:


Years Active: 2026

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2 patents (USPTO):Explore Patents

Title: Mateusz Monterial and Innovations in Time-of-Flight Sensing

Introduction

Mateusz Monterial is an inventor based in Livermore, California, whose patent work focuses on improving the reliability and performance of three-dimensional time-of-flight (TOF) sensors. His listed portfolio includes 2 patents, addressing measurement precision and sensor defect detection. He is associated with GM Cruise Holdings LLC.

Latest Patents

Monterial’s patent, “Precision Prediction of Time-of-Flight Sensor Measurements,” describes techniques for estimating the reliability of depth measurements captured by a TOF camera. The system uses correlation samples from reflected signals, grayscale image data, and other parameters to assess measurement precision.

His patent, “Detecting Sensor Defects for Three-Dimensional Time-of-Flight Sensors,” presents a method for identifying potential sensor defects. It analyzes digitized measurements taken at different signal phases and uses them to generate a confidence-map value for a pixel in an image frame.

Career Highlights

The available patent information highlights Monterial’s work on sensor measurement quality and diagnostics. These technologies are relevant to systems that rely on accurate depth data, including applications in advanced sensing and mobility.

Collaborations

Monterial is associated with GM Cruise Holdings LLC. His listed coworkers include Zhanping Xu and Kartheek Chandu.

Conclusion

Mateusz Monterial’s patents address two important challenges in TOF sensing: evaluating the precision of depth measurements and detecting sensor defects.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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