The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2026

Filed:

Sep. 28, 2023
Applicant:

GM Cruise Holdings Llc, San Francisco, CA (US);

Inventors:

Zhanping Xu, Sunnyvale, CA (US);

Mateusz Monterial, Livermore, CA (US);

Kartheek Chandu, Dublin, CA (US);

Alexander Lesnick, Alexandria, VA (US);

Robert Vets, Seattle, WA (US);

Glenn D. Sweeney, Sebastopol, CA (US);

Brandon S. Seilhan, San Ramon, CA (US);

Assignee:

GM CRUISE HOLDINGS LLC, San Francisco, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 25/68 (2023.01); H03M 1/12 (2006.01);
U.S. Cl.
CPC ...
H04N 25/68 (2023.01); H03M 1/12 (2013.01);
Abstract

Described herein are systems and techniques for evaluating whether components of a sensing device are functioning properly. An example method includes obtaining a first set of measurements corresponding to a pixel from a first image frame captured by a sensor, wherein each respective measurement from the first set of measurements is associated with a different signal phase; converting the first set of measurements using an analog to digital converter (ADC) to yield a first set of digitized measurements; and determining, based on the first set of digitized measurements, a first confidence map value that corresponds to the pixel from the first image frame, wherein the first confidence map value is indicative of at least one defect in the sensor.


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