This inventor holds 1 USPTO granted patent. Top assignee: Hitachi High-Tech Science Corporation. Active years: 2020.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2020
Title: Masayuki Iwasa: Inventor of a Scanning Probe Microscope
Introduction
Masayuki Iwasa is an inventor based in Tokyo, Japan, associated with Hitachi High-Tech Science Corporation. His patent work concerns scanning probe microscopy and ways to make measurement data easier to interpret.
Latest Patents
The provided information lists one patent for Iwasa: “Scanning Probe Microscope.” The invention describes a system that calculates a distribution image of measurement data and a second distribution image showing differential data between adjacent measurement elements. A display controller can select either image or show both on a display, enabling users to view measurement results alongside edge-enhanced information. The patent record reports 1 patent.
Career Highlights
Iwasa’s listed invention focuses on improving the presentation and usability of scanning probe microscope measurements. By making measurement data and differential images available selectively or together, the system supports clearer examination of measured features.
Collaborations
Iwasa is associated with Hitachi High-Tech Science Corporation. The provided information also names Shinya Kudo and Toshihiro Ueno as coworkers.
Conclusion
Masayuki Iwasa’s patent reflects an effort to improve how scanning probe microscope data is displayed and interpreted, combining measurement distributions with differential imagery for greater user convenience.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile