The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2020
Filed:
Jan. 25, 2019
Hitachi High-tech Science Corporation, Tokyo, JP;
Masayuki Iwasa, Tokyo, JP;
Yoshiteru Shikakura, Tokyo, JP;
Shinya Kudo, Toyko, JP;
Toshihiro Ueno, Toyko, JP;
HITACHI HIGH-TECH SCIENCE CORPORATION, Tokyo, JP;
Abstract
Provided is a scanning probe microscope with which measurement data and a distribution image of differential data of the measurement data can be displayed selectively or together, an edge enhancement image can be obtained, and user convenience is improved. A scanning probe microscope () includes: a distribution image calculator () configured to calculate a one-dimensional or two-dimensional first distribution image () of measurement data, and a one-dimensional or two-dimensional second distribution image () of differential data of adjacent data elements of the measurement data; and a display controller () configured to instruct the distribution image calculator to calculate at least one of the first distribution image or the second distribution image, and to display the calculated distribution image on a predetermined display.