This inventor holds 2 USPTO granted patents. Top assignee: Nidec-Read Corporation. Active years: 2004-2006.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2004-2006
Title: Masayoshi Yamada: Innovator in Circuit Board Testing Technology
Introduction
Masayoshi Yamada is a notable inventor based in Shiga-cho, Japan. He has made significant contributions to the field of circuit board testing, holding 2 patents that showcase his innovative approach to technology.
Latest Patents
Yamada's latest patents include a circuit-based testing apparatus and method for testing a circuit board. This apparatus is designed to test the continuity and/or short-circuit of wirings formed on a circuit board. It features an electromagnetic wave irradiator that irradiates the first terminals of the wirings with an electromagnetic wave, allowing electrons to be discharged from these terminals through the photoelectric effect. The discharged electrons are then trapped by an electrode, which is electrically biased to have a higher potential than that of the second terminals of the wirings. This process causes an electric current to flow through the wirings via the electrode. The existence of open-circuit and/or short-circuit conditions in the wirings is determined based on the current flowing through them.
Career Highlights
Masayoshi Yamada is currently employed at Nidec-Read Corporation, where he continues to develop innovative technologies in circuit testing. His work has been instrumental in advancing the reliability and efficiency of electronic devices.
Collaborations
Yamada collaborates with fellow inventor Yoshio Tsuji, contributing to the development of cutting-edge technologies in their field.
Conclusion
Masayoshi Yamada's contributions to circuit board testing technology highlight his innovative spirit and dedication to improving electronic testing methods. His patents reflect a deep understanding of the complexities involved in circuit design and testing.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile