Tokyo, Japan

Masatsugu Kawamoto


Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2022

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1 patent (USPTO):Explore Patents

Title: Masatsugu Kawamoto: Innovator in Charged Particle Beam Technology

Introduction: Masatsugu Kawamoto is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of charged particle beam systems, particularly in the context of scanning electron microscopy. His innovative work has led to advancements that enhance the precision and safety of sample measurements.

Latest Patents: Kawamoto holds a patent for a "Charged particle beam system and method of measuring sample using scanning electron microscope." This invention involves generating first shape data that represents a three-dimensional shape of a sample unit, which includes the sample itself. Additionally, second shape data is created to represent a three-dimensional shape of a structure within the sample chamber. The movement of the sample unit is then controlled based on both sets of shape data to prevent any collision with the structure.

Career Highlights: Kawamoto is associated with Jeol Ltd., a company known for its advanced scientific instruments and technology. His work at Jeol Ltd. has positioned him as a key player in the development of innovative measurement techniques.

Collaborations: Kawamoto has collaborated with notable colleagues, including Yoshikazu Nemoto and Yuta Murakami. Their combined expertise has contributed to the success of various projects within the company.

Conclusion: Masatsugu Kawamoto's contributions to charged particle beam technology exemplify the impact of innovation in scientific measurement. His patent and collaborative efforts continue to influence advancements in the field.

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