This inventor holds 1 USPTO granted patent. Top assignees: Tokyo Electron Kabushiki Kaisha, Tokyo Electron Tohoku Kabushiki Kaisha. Active years: 1994.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:


Years Active: 1994
Title: The Innovative Contributions of Masato Asakawa
Introduction
Masato Asakawa is a notable inventor based in Machida, Japan. He has made significant contributions to the field of semiconductor technology, particularly with his innovative devices designed for detecting the presence of transparent materials. His work has implications for various industries, including electronics and manufacturing.
Latest Patents
Asakawa holds a patent for a substrate detecting device that is capable of detecting the presence of a semiconductor wafer in a non-contact manner, regardless of its transparency or opacity. This device utilizes a combination of light emitting/receiving sensors and light receiving sensors arranged in pairs. The technology allows for the detection of both transparent and opaque wafers by analyzing the light reflected from their surfaces. The patent highlights the intricate design of the sensor support board, which facilitates accurate detection through alternating arrangements of sensors.
Career Highlights
Throughout his career, Masato Asakawa has worked with prominent companies in the semiconductor industry, including Tokyo Electron and Tokyo Electron Tohoku. His experience in these organizations has contributed to his expertise in developing advanced detection technologies.
Collaborations
Asakawa has collaborated with notable colleagues such as Shunetsu Endo and Mitsuo Kato. Their combined efforts have furthered the development of innovative solutions in the field of semiconductor detection.
Conclusion
Masato Asakawa's contributions to semiconductor technology through his patented innovations demonstrate his significant role in advancing the industry. His work continues to influence the way transparent and opaque materials are detected in various applications.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile