Ibaraki, Japan

Masashi Kuwahara


Average Co-Inventor Count = 4.8

ph-index = 3

Forward Citations = 22(Granted Patents)


Location History:

  • Tsukuba JP (2004)
  • Tsukubasi, JP (2008)
  • Tsukuba, JP (2003 - 2012)
  • Ibaraki, JP (2008 - 2012)

Company Filing History:


Years Active: 2003-2012

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8 patents (USPTO):Explore Patents

Title: Masashi Kuwahara: Innovator in Optical Measurement and Pattern Formation

Introduction

Masashi Kuwahara is a prominent inventor based in Ibaraki, Japan. He has made significant contributions to the fields of optical measurement and pattern formation, holding a total of eight patents. His innovative work has advanced the understanding and application of optical technologies in various materials.

Latest Patents

Kuwahara's latest patents include an "Optical measurement apparatus and optical measurement method for a liquid or molten material." This invention features a transparent container capable of holding a to-be-measured material, equipped with an optical device that irradiates light to the container's bottom face and detects reflected light for measurement. Another notable patent is for "Pattern forming materials and pattern formation method using the materials." This invention involves a thermal sensitive material layer on a substrate, with light-to-heat converting layers that enable the formation of fine patterns using heat generated in the layers.

Career Highlights

Throughout his career, Kuwahara has worked at the National Institute of Advanced Industrial Science and Technology, where he has contributed to various research projects and innovations. His work has been instrumental in developing new technologies that enhance optical measurement techniques and pattern formation processes.

Collaborations

Kuwahara has collaborated with notable colleagues, including Junji Tominaga and Takayuki Shima. These collaborations have fostered a productive environment for innovation and have led to significant advancements in their respective fields.

Conclusion

Masashi Kuwahara's contributions to optical measurement and pattern formation demonstrate his expertise and commitment to innovation. His patents reflect a deep understanding of materials and technologies that continue to influence the industry.

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