The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 14, 2012
Filed:
Jun. 23, 2009
Masashi Kuwahara, Tsukuba, JP;
Toshio Fukaya, Tsukuba, JP;
Takayuki Shima, Tsukuba, JP;
Junji Tominaga, Tsukuba, JP;
Rie Endo, Tokyo, JP;
Masahiro Susa, Tokyo, JP;
Michio Suzuki, Tokyo, JP;
Koichi Tsutsumi, Tokyo, JP;
Masashi Kuwahara, Tsukuba, JP;
Toshio Fukaya, Tsukuba, JP;
Takayuki Shima, Tsukuba, JP;
Junji Tominaga, Tsukuba, JP;
Rie Endo, Tokyo, JP;
Masahiro Susa, Tokyo, JP;
Michio Suzuki, Tokyo, JP;
Koichi Tsutsumi, Tokyo, JP;
National Institute of Advanced Industrial Science and Technology, Tokyo, JP;
J. A. Woolam Japan Corporation, Tokyo, JP;
Abstract
An apparatus for optical measurement of a liquid or molten material, which has: a transparent container which has a bottom face and is capable of containing a to-be-measured material therein, with the bottom face at least having a flat face and being transparent; and an optical device that irradiates a light to the bottom face of the container and that detects and measures a reflected light from the bottom face; and a method for optically measuring a liquid or molten material using the apparatus.