Aichi, Japan

Masanori Yatani

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Nidek Co., Ltd.. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Masanori Yatani. Retrieved from https://idiyas.com/inventor/masanori-yatani

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

 

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Masanori Yatani: Innovator in Ophthalmologic Measurement Technology

Introduction

Masanori Yatani is a prominent inventor based in Aichi, Japan. He has made significant contributions to the field of ophthalmology through his innovative inventions. His work focuses on improving the accuracy and efficiency of eye measurement technologies.

Latest Patents

Masanori Yatani holds a patent for an ophthalmologic measurement apparatus, ophthalmologic measurement system, and ophthalmologic measurement program. This invention provides an advanced solution for measuring a subject's eye. The apparatus includes measurement means for objectively measuring eye refractive power, acquisition means for obtaining intraocular lens information, and correction means for adjusting the measurement results based on the acquired information. He has 1 patent to his name.

Career Highlights

Yatani is associated with Nidek Co., Ltd., a company known for its cutting-edge ophthalmic equipment. His role at Nidek has allowed him to contribute to the development of innovative technologies that enhance eye care.

Collaborations

Masanori Yatani has worked alongside notable colleagues, including Michihiro Takii and Kazunari Shimizu. Their collaborative efforts have further advanced the field of ophthalmologic measurement.

Conclusion

Masanori Yatani's contributions to ophthalmology through his patented inventions demonstrate his commitment to improving eye care technology. His work continues to influence the industry and enhance the accuracy of eye measurements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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