The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 2025
Filed:
Dec. 07, 2020
Applicant:
Nidek Co., Ltd., Aichi, JP;
Inventors:
Michihiro Takii, Aichi, JP;
Masanori Yatani, Aichi, JP;
Kazunari Shimizu, Aichi, JP;
Tetsuya Yamamoto, Aichi, JP;
Assignee:
NIDEK CO., LTD., Aichi, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 3/103 (2006.01); A61B 3/00 (2006.01); A61B 3/028 (2006.01); A61B 3/107 (2006.01); A61B 3/12 (2006.01);
U.S. Cl.
CPC ...
A61B 3/103 (2013.01); A61B 3/0025 (2013.01); A61B 3/0033 (2013.01); A61B 3/0041 (2013.01); A61B 3/028 (2013.01); A61B 3/107 (2013.01); A61B 3/12 (2013.01);
Abstract
There is provided an ophthalmologic measurement apparatus for measuring a subject eye. The apparatus includes measurement means for objectively measuring eye refractive power of the subject eye, acquisition means for acquiring intraocular lens information relating to an intraocular lens inserted into the subject eye, and correction means for correcting a measurement result of the eye refractive power, based on the intraocular lens information.