Tokyo, Japan

Masanori Matsuda

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Kabushiki Kaisha Toshiba. Active years: 2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Masanori Matsuda. Retrieved from https://idiyas.com/inventor/masanori-matsuda-uqrt34g2

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2018

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1 patent (USPTO):Explore Patents

Title: Masanori Matsuda: Semiconductor Acoustic Measurement Innovation

Introduction

Masanori Matsuda is an inventor based in Tokyo, Japan, associated with Kabushiki Kaisha Toshiba. His patent work includes a semiconductor acoustic measurement device designed to determine whether a second ultrasonic measurement should be performed.

Latest Patents

Matsuda is credited with 1 patent: “Semiconductor acoustic measurement device that determines the presence or absence of the second ultrasonic measurement.” The disclosed device includes a controller, two detectors, and a determiner. During the first measurement, one detector records a value correlated with the propagation time of an acoustic wave. The determiner compares that value with an earlier first-measurement value to decide whether to conduct a second measurement. If performed, the second detector records a corresponding value during the second detection period.

Career Highlights

Matsuda’s listed invention concerns semiconductor-based acoustic measurement and the use of comparison results to guide whether an additional ultrasonic measurement is needed. This approach makes the measurement decision part of the device’s control process.

Collaborations

Matsuda’s listed coworkers include Junichi Takeda and Masakazu Yaginuma. The patent information associates his work with Kabushiki Kaisha Toshiba.

Conclusion

Masanori Matsuda’s recorded patent reflects work on semiconductor acoustic measurement, using earlier and current measurement values to determine whether a second ultrasonic measurement should take place.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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