The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 16, 2018

Filed:

Mar. 09, 2016
Applicant:

Kabushiki Kaisha Toshiba, Minato-Ku, Tokyo, JP;

Inventors:

Masanori Matsuda, Edogawa Tokyo, JP;

Junichi Takeda, Yokohama Kanagawa, JP;

Masakazu Yaginuma, Yokosuka Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01F 1/66 (2006.01);
U.S. Cl.
CPC ...
G01F 1/667 (2013.01);
Abstract

A semiconductor device according to the present embodiment is provided with a controller, a first detector, a second detector, and a determiner. In a first measurement, the first detector detects a first measured value correlated with the propagation time of the first acoustic wave in a first detection period from the transmission to the reception of the first acoustic wave. In a second measurement, the second detector detects a second measured value correlated with the propagation time of the second acoustic wave in a second detection period from the transmission to the reception of the second acoustic wave. The determiner determines the presence or absence of the second measurement on the basis of the result of comparison between the first measured value and another first measured value measured earlier than the first measured value.


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