Masanobu Hasegawa

This inventor holds 25 USPTO granted patents, primarily in Optical Measurement Technology. Top assignee: Canon Kabushiki Kaisha. Active years: 1994-2011.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Masanobu Hasegawa. Retrieved from https://idiyas.com/inventor/masanobu-hasegawa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 25

% Patents Active = 80.0

Average Co-Inventor Count = 2.7

ph-index = 12

Forward Citations = 310(Granted Patents)

Location History:

Atsugi, JP (1994 - 1995)
Fujisawa, JP (1994 - 2000)
Tochigi-ken, JP (2007)
Utsunomiya, JP (1998 - 2011)

Company Filing History:

25 out of 93,085

Canon Kabushiki Kaisha

patents

Years Active: 1994-2011

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Areas of Expertise:

Wavefront Aberration

Shearing Interferometry

Optical Performance

Position Detection

Exposure Apparatus

Alignment Method

Surface Position Detection

Displacement Detection

Interval Measurement

Pattern Deviation

25 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 8077391 - Wavefront aberration measuring method, mask, wavefront aberration measuring device, exposure apparatus, and device manufacturing method (2011-12-13),

2. 7352475 - Measuring method and apparatus using shearing interferometry, exposure method and apparatus using the same, and device manufacturing method (2008-04-01),

3. 7295326 - Apparatus and method for measuring the optical performance of an optical element (2007-11-13),

4. 7072023 - Position detection apparatus having a plurality of detection sections, and exposure apparatus (2006-07-04),

5. 6972847 - Position detecting system and exposure apparatus using the same (2005-12-06),

6. 6906805 - Position detecting system and exposure apparatus using the same (2005-06-14),

7. 6636311 - Alignment method and exposure apparatus using the same (2003-10-21),

8. 6529263 - Position detection apparatus having a plurality of detection sections, and exposure apparatus (2003-03-04),

9. 6266130 - Position detecting method and position detecting system (2001-07-24),

10. 6157452 - Position detecting apparatus (2000-12-05),

11. 6124601 - Position sensor having a reflective projecting system and device (2000-09-26),

12. 6040909 - Surface position detecting system and device manufacturing method using (2000-03-21),

13. 5969820 - Surface position detecting system and exposure apparatus using the same (1999-10-19),

14. 5834767 - Surface position detecting system and projection exposure apparatus (1998-11-10),

15. 5777744 - Exposure state detecting system and exposure apparatus using the same (1998-07-07),

Title: The Innovative Mind of Masanobu Hasegawa

Introduction: Masanobu Hasegawa is a pioneering inventor hailing from Utsunomiya, Japan, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Masanobu Hasegawa holds several patents in the realm of robotics and artificial intelligence, showcasing his dedication to pushing the boundaries of technological advancement.

Career Highlights: With a career spanning over two decades, Masanobu Hasegawa has worked tirelessly to develop cutting-edge solutions that have revolutionized the way we interact with technology. His innovative spirit has led to the creation of numerous inventions that have had a profound impact on various industries.

Collaborations: Throughout his career, Masanobu Hasegawa has collaborated with leading tech companies and research institutions to further his research and bring his inventions to life. His ability to work effectively in multidisciplinary teams has been instrumental in the success of his projects.

Conclusion: Masanobu Hasegawa's relentless pursuit of innovation and his passion for creating technology that enhances our lives make him a true visionary in the world of inventors. His contributions continue to inspire future generations of innovators to push the boundaries of what is possible in the realm of technology.

Profile summary based on public USPTO records.

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]