Aichi, Japan

Masamichi Iwamoto

This inventor holds 1 USPTO granted patent. Top assignee: Meinan Machinery Works, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Masamichi Iwamoto. Retrieved from https://idiyas.com/inventor/masamichi-iwamoto

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Masamichi Iwamoto and Plywood Defect Inspection

Introduction

Masamichi Iwamoto is an inventor associated with Meinan Machinery Works, Inc., in Aichi, Japan. His patent work addresses the inspection of plywood for defects, including warpage and bending.

Latest Patents

The provided information lists one patent for Iwamoto: “Defect Inspection System and Defect Inspection Method.” The system captures images of the plywood’s front and back surfaces as it moves along belt conveyors, generating depth information. Separate shape-measurement units measure the plywood away from the imaging gap, where conveyor vibrations could affect measurements. The system uses this shape information to correct the depth information before detecting defects. This approach is designed to identify warpage and bending accurately without flattening or otherwise deforming the plywood during correction.

Career Highlights

Iwamoto’s listed patent reflects work on industrial inspection technology for plywood. The invention combines image-based depth data with shape measurements to improve defect detection under production-line conditions.

Collaborations

The provided information names Takehiko Tokuyama and Keijiro Yamaguchi as Iwamoto’s coworkers. Their specific roles in the patent or related work are not specified.

Conclusion

Masamichi Iwamoto’s listed invention focuses on improving plywood inspection by accounting for conveyor-related vibration while preserving the material’s natural shape.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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