The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2026

Filed:

Sep. 03, 2024
Applicant:

Meinan Machinery Works, Inc., Aichi, JP;

Inventors:

Masamichi Iwamoto, Aichi, JP;

Takehiko Tokuyama, Aichi, JP;

Keijiro Yamaguchi, Aichi, JP;

Masato Miura, Aichi, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G01N 21/88 (2006.01); G01N 21/89 (2006.01); G06T 7/50 (2017.01); H04N 23/56 (2023.01); H04N 23/90 (2023.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); G01N 21/8806 (2013.01); G01N 21/8914 (2013.01); G06T 7/50 (2017.01); H04N 23/56 (2023.01); H04N 23/90 (2023.01); G06T 2207/10024 (2013.01); G06T 2207/10028 (2013.01); G06T 2207/30161 (2013.01);
Abstract

Images of a face surface and a back surface of a plywoodthat is conveyed on belt conveyorsU andD are captured by imaging devices of first illumination and imaging unitsF andB to generate depth information, a shape of the plywoodis measured by shape measurement unitsF andB, which are provided at locations different from a location of a gapwhere the image capturing is performed, to generate shape information, and the depth information is corrected based on the shape information, and then a defect in the plywoodis detected based on the depth information. By detecting a defect in the plywoodbased on the depth information corrected using the shape information that is measured without being affected by vibrations that occur when the plywoodis conveyed over the gap, a defect such as warpage or bending can be accurately detected without deformation occurring in the plywoodbeing flattened by the correction of the depth information.


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Iwamoto, Masamichi. (2026). Defect inspection system and defect inspection method (U.S. Patent No. 12602765). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12602765

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