Aichi, Japan

Keijiro Yamaguchi

This inventor holds 1 USPTO granted patent. Top assignee: Meinan Machinery Works, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Keijiro Yamaguchi. Retrieved from https://idiyas.com/inventor/keijiro-yamaguchi-b06b4cvc

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Keijiro Yamaguchi and Plywood Defect Inspection

Introduction

Keijiro Yamaguchi is an inventor associated with Meinan Machinery Works, Inc., in Aichi, Japan. His patent work addresses the accurate detection of defects in plywood during conveyor-based inspection.

Latest Patents

The provided information lists one patent for Yamaguchi: “Defect Inspection System and Defect Inspection Method.” The invention captures images of the plywood’s face and back surfaces as it moves along belt conveyors, generating depth information. Separate shape-measurement units measure the plywood away from the imaging gap, where conveyor vibrations could affect measurements. The system uses this shape information to correct the depth information before detecting defects. This approach is designed to identify warpage and bending accurately without flattening or otherwise distorting the plywood through correction.

Career Highlights

Yamaguchi’s listed patent reflects work on industrial inspection technology that combines imaging, shape measurement, and data correction. The supplied information identifies him as an inventor on one patent and associates him with Meinan Machinery Works, Inc.

Collaborations

Masamichi Iwamoto and Takehiko Tokuyama are listed as Yamaguchi’s coworkers. The provided information does not specify their roles in the patent or the extent of their collaboration.

Conclusion

Keijiro Yamaguchi’s listed invention focuses on improving plywood defect detection by correcting imaging data with shape measurements taken away from conveyor vibrations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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