This inventor holds 1 USPTO granted patent. Top assignee: Atago Co., Ltd.. Active years: 2009.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2009
Title: Masaki Osawa: Innovator in Refractometry
Introduction
Masaki Osawa is a notable inventor based in Saitama, Japan, recognized for his contributions to the field of refractometry. With a single patented invention to his name, Osawa has made strides in accurately measuring the refractive index of various samples. His innovative approach has implications across scientific and industrial applications.
Latest Patents
Masaki Osawa holds a patent for a refractometer designed to enhance measurement accuracy. This refractometer consists of a prism with an interface contacting the sample, complemented by a light source that radiates light towards the interface. A photoelectric sensor receives light reflected at this interface and directed outward from the prism's exit face. Notably, the design includes a sample stage with a non-adhesive coating and a filter means featuring a wavelength filter that selectively transmits light within a specified region, ensuring precision in measurements.
Career Highlights
Osawa is affiliated with Atago Co., Ltd., a company specializing in optical instruments and measurement technology. His contributions within the organization emphasize innovation and quality in refractive index measurement tools. Osawa's commitment to advancement has solidified his reputation in the scientific community.
Collaborations
Throughout his career, Masaki Osawa has collaborated with colleagues such as Yoshinori Nakajima and Hideyuki Amamiya. These partnerships demonstrate the collaborative spirit within the research and development sphere, fostering an environment where innovative ideas can thrive.
Conclusion
Masaki Osawa's work on the refractometer illustrates the impact of innovation in scientific measurement. With his patent, he has opened doors to improved accuracy and reliability in refractive index measurements, contributing to advancements across various industries. As a dedicated inventor, Osawa’s journey continues to inspire future innovations in refractometry and beyond.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
