The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 17, 2009
Filed:
Oct. 28, 2003
Yoshinori Nakajima, Saitama, JP;
Hideyuki Amamiya, Saitama, JP;
Masaki Osawa, Saitama, JP;
Kiminori Sekiguchi, Higashimatsuyama, JP;
Yoshinori Nakajima, Saitama, JP;
Hideyuki Amamiya, Saitama, JP;
Masaki Osawa, Saitama, JP;
Kiminori Sekiguchi, Higashimatsuyama, JP;
Atago Co., Ltd., Tokyo, JP;
Abstract
A refractometer for measuring refractive index of a sample comprising a prism having an interface contacting the sample, a light source that radiates light towards the interface from an entrance face of the prism, and a photoelectric sensor for receiving light reflected at the interface and directed outward from an exit face of the prism. The light source and the photoelectric sensor are secured to the prism. The refractometer comprises a sample stage arranged surrounding the interface surface. This sample stage provides a non-adhesive coating formed on the surface thereof. The refractometer comprises filter means arranged between the interface surface and the photoelectric sensor. This filter means includes a wavelength filter that selectively allows transmission of light having a wavelength within a prescribed region, including a wavelength of light of the light source.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile