Vancouver, WA, United States of America

Masakazu Yanase

This inventor holds 3 USPTO granted patents. Top assignee: Sharp Laboratories of America, Inc. Active years: 2012-2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Masakazu Yanase. Retrieved from https://idiyas.com/inventor/masakazu-yanase

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 3.0

ph-index = 2

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 2012-2015

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3 patents (USPTO):Explore Patents

Title: Masakazu Yanase: Innovator in Defect Detection Technologies

Introduction

Masakazu Yanase is a prominent inventor based in Vancouver, WA (US). He has made significant contributions to the field of image processing and defect detection technologies. With a total of 3 patents to his name, Yanase has established himself as a key figure in his area of expertise.

Latest Patents

Yanase's latest patents include innovative methods and systems for defect detection and classification. One of his notable inventions is related to image-based automatic detection of defective areas in flat panel displays, along with the classification of defect types and their causes. Another significant patent focuses on a system for feature detection in low contrast images, which aids in the identification of feature points that may otherwise be overlooked.

Career Highlights

Masakazu Yanase is currently employed at Sharp Laboratories of America, Inc., where he continues to develop cutting-edge technologies. His work has been instrumental in advancing the capabilities of defect detection systems, making them more efficient and reliable.

Collaborations

Yanase has collaborated with talented individuals in his field, including Xinyu Xu and Chang Yuan. These partnerships have fostered innovation and have contributed to the success of his projects.

Conclusion

Masakazu Yanase is a dedicated inventor whose work in defect detection technologies has made a significant impact in the industry. His innovative patents and collaborations highlight his commitment to advancing technology in this vital area.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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