The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 11, 2012
Filed:
Jul. 29, 2010
Applicants:
Chang Yuan, Vancouver, WA (US);
Masakazu Yanase, Vancouver, WA (US);
Xinyu Xu, Vancouver, WA (US);
Inventors:
Assignee:
Sharp Laboratories of America, Inc., Camas, WA (US);
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
Aspects of the present invention are related to systems, methods and apparatus for image-based automatic defect detection.
Yuan, Chang. (2012). Methods, systems and apparatus for defect detection (U.S. Patent No. 8331650). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8331650
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile