Tokyo, Japan

Masakatu Saijyo


Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2004

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1 patent (USPTO):Explore Patents

Title: Masakatu Saijyo: Innovator in Semiconductor Testing Technology

Introduction

Masakatu Saijyo is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of semiconductor testing technology. His innovative work has led to the development of a unique substrate for probe cards, which plays a crucial role in testing integrated circuit (IC) devices.

Latest Patents

Masakatu Saijyo holds a patent for a "Substrate for a probe card having conductive layers for supplying power to IC devices." This invention includes tester power supply terminals that receive a power supply voltage output from a tester. The power supply terminals are connected to the semiconductor IC device to be tested. Additionally, at least two power supply layers connect one of the tester power supply terminals to the power supply terminals. This innovation enhances the efficiency and reliability of semiconductor testing.

Career Highlights

Masakatu Saijyo is associated with Oki Electric Industry Co., Ltd., a leading company in the electronics sector. His work at Oki Electric has allowed him to focus on advancing technologies that improve semiconductor testing processes. His dedication to innovation has positioned him as a key figure in his field.

Collaborations

Masakatu has collaborated with notable colleagues, including Yoshimi Nakamura and Junichi Matsumoto. These partnerships have fostered a creative environment that encourages the development of cutting-edge technologies in semiconductor testing.

Conclusion

Masakatu Saijyo's contributions to semiconductor testing technology exemplify the impact of innovation in the electronics industry. His patent and collaborative efforts continue to influence advancements in this critical field.

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