Shiga, Japan

Masahiro Kinugasa

This inventor holds 1 USPTO granted patent. Top assignees: Nisshin Seifun Group Inc., Oriental Yeast Co., Ltd.. Active years: 2009.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Masahiro Kinugasa. Retrieved from https://idiyas.com/inventor/masahiro-kinugasa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2009

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1 patent (USPTO):Explore Patents

Title: Masahiro Kinugasa: Innovator in Wheat Quality Estimation

Introduction

Masahiro Kinugasa is a notable inventor based in Shiga, Japan. He has made significant contributions to the field of agricultural science, particularly in the estimation of wheat quality. His innovative approach has the potential to enhance the efficiency of wheat production.

Latest Patents

Kinugasa holds a patent for a method that estimates the end-use qualities of wheat at the growth stage. This invention provides a means for predicting the quality of wheat flour that can be obtained from harvested wheat before the seeds mature. The method involves measuring the expression level of specific genes in immature wheat, which are defined by nucleotide sequences.

Career Highlights

Throughout his career, Kinugasa has worked with prominent companies in the food industry, including Oriental Yeast Co., Ltd. and Nisshin Seifun Group Inc. His work has focused on improving agricultural practices and ensuring better quality in wheat production.

Collaborations

Kinugasa has collaborated with notable colleagues such as Kouji Uchida and Katsuyuki Hayakawa. These partnerships have contributed to the advancement of research in wheat quality estimation.

Conclusion

Masahiro Kinugasa's innovative methods in estimating wheat quality represent a significant advancement in agricultural science. His contributions are poised to impact the industry positively and enhance the quality of wheat products.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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