The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 2009
Filed:
Sep. 15, 2005
Katsuyuki Hayakawa, Saitama, JP;
Yosuke Kikuchi, Saitama, JP;
Hirofumi Motoi, Saitama, JP;
Kouji Uchida, Shiga, JP;
Masahiro Kinugasa, Shiga, JP;
Katsuyuki Hayakawa, Saitama, JP;
Yosuke Kikuchi, Saitama, JP;
Hirofumi Motoi, Saitama, JP;
Kouji Uchida, Shiga, JP;
Masahiro Kinugasa, Shiga, JP;
Nisshin Seifun Group Inc., Tokyo, JP;
Oriental Yeast Co., Ltd., Tokyo, JP;
Abstract
The invention provides a means for estimating the end use qualities of wheat flour that will be obtained in the future from the harvested wheat at an early stage before maturation of the wheat seeds. The invention relates to a method for estimating the end use qualities of a matured wheat seed, comprising measuring the expression level of at least 1 gene selected from genes, each of which is defined by any one of the nucleotide sequences of SEQ ID NOS: 1 to 121 in immature wheat.