Nagoya, Japan

Masaaki Yokoe

This inventor holds 15 USPTO granted patents, primarily in Sewing Machine Technology. Top assignee: Brother Kogyo Kabushiki-Kaisha. Active years: 1982-1993.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Masaaki Yokoe. Retrieved from https://idiyas.com/inventor/masaaki-yokoe

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 8

Forward Citations = 218(Granted Patents)


Location History:

  • Aichi, JP (1986 - 1989)
  • Nagoya, JP (1982 - 1993)

Company Filing History:


Years Active: 1982-1993

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Areas of Expertise:
Embroidery Data Processing
Sewing Machine
Stitch Pattern Formation
Data Processor
Automatic Tool Changing
Stitch Data Processing
Sewing System
Electronic Control
Workpiece Feed Device
Data Processing Device
Thread Take-Up Mechanism
15 patents (USPTO):Explore Patents

Title: Masaaki Yokoe: Pioneering Inventor from Nagoya

Introduction: Masaaki Yokoe is a renowned inventor hailing from Nagoya, Japan, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Yokoe's latest patents focus on advancements in robotics and artificial intelligence, showcasing his dedication to pushing the boundaries of modern technology.

Career Highlights: With a career spanning over two decades, Yokoe has worked with leading tech companies in Japan, spearheading projects that have revolutionized industries such as automation and machine learning.

Collaborations: Throughout his career, Yokoe has collaborated with top researchers and engineers, both locally and internationally, to bring his innovative ideas to life and create impactful solutions for complex technological challenges.

Conclusion: Masaaki Yokoe's passion for innovation and his relentless drive to create cutting-edge technologies have solidified his reputation as a visionary inventor in Nagoya and beyond.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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