This inventor holds 1 USPTO granted patent. Top assignee: Tma Technologies, Inc.. Active years: 1993.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1993
Title: Marvin L. Bernt: Innovator in Optical Measurement Technology
Introduction
Marvin L. Bernt is a notable inventor based in Bozeman, MT (US). He has made significant contributions to the field of optical measurement technology. His innovative work has led to the development of a unique device that enhances the accuracy and feasibility of light scatter measurements.
Latest Patents
Marvin holds a patent for a "Modular scatterometer with interchangeable scanning heads." This optical measurement device produces quality light scatter measurements using Bidirectional Reflective Distribution Function (BRDF) techniques. It analyzes data generated from an accurate, portable, and relatively inexpensive scatterometer. The device features interchangeable scanning heads, each equipped with ROM data storage containing configuration information. This innovation allows for measurements of light scatter across a wide variety of applications and samples, even under environmental conditions where such measurements were previously unfeasible.
Career Highlights
Marvin is associated with Tma Technologies, Inc., where he continues to push the boundaries of optical measurement technology. His work has been instrumental in advancing the capabilities of scatterometry, making it more accessible and effective for various applications.
Collaborations
Marvin has collaborated with notable colleagues, including Kelly H. Kirchner and James A. Bender. Their combined expertise has contributed to the success of their projects and innovations.
Conclusion
Marvin L. Bernt's contributions to optical measurement technology exemplify the spirit of innovation. His patented modular scatterometer represents a significant advancement in the field, showcasing his dedication to improving measurement techniques.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile