Wittenberg, Germany

Martin Weinigel

This inventor holds 1 USPTO granted patent. Top assignee: Burnham Institute for Medical Research. Active years: 2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Martin Weinigel. Retrieved from https://idiyas.com/inventor/martin-weinigel-j0yz93vu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 11(Granted Patents)


Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: The Innovations of Martin Weinigel

Introduction

Martin Weinigel is an accomplished inventor based in Wittenberg, Germany. He has made significant contributions to the field of automated scanning cytometry. His innovative approach utilizes chromatic aberration for multiplanar image acquisition, showcasing his expertise in medical research technology.

Latest Patents

Weinigel holds a patent for his invention titled "Automated scanning cytometry using chromatic aberration for multiplanar image acquisition." This patent represents a breakthrough in the efficiency and accuracy of image acquisition in cytometry, with a focus on automation.

Career Highlights

Martin Weinigel is affiliated with the Burnham Institute for Medical Research, where he has been instrumental in advancing research methodologies. His work has garnered attention for its potential applications in various medical fields.

Collaborations

Weinigel collaborates with notable colleagues, including Jeffrey H. Price and Derek Fuller. Their combined expertise contributes to the innovative environment at the Burnham Institute.

Conclusion

Martin Weinigel's contributions to automated scanning cytometry exemplify the impact of innovation in medical research. His work continues to influence the field and pave the way for future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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