The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 24, 2014
Filed:
Oct. 14, 2009
Applicants:
Jeffrey H. Price, Rancho Santa Fe, CA (US);
Martin Weinigel, Wittenberg, DE;
Derek N. Fuller, San Diego, CA (US);
Albert L. Kellner, San Diego, CA (US);
Inventors:
Jeffrey H. Price, Rancho Santa Fe, CA (US);
Martin Weinigel, Wittenberg, DE;
Derek N. Fuller, San Diego, CA (US);
Albert L. Kellner, San Diego, CA (US);
Assignee:
Burnham Institute for Medical Research, La Jolla, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
In an automated scanning cytometry system, chromatic aberration is used for multiplanar image acquisition.
Price, Jeffrey. (2014). Automated scanning cytometry using chromatic aberration for multiplanar image acquisition (U.S. Patent No. 8760756). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8760756
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile