Martin Petrek

Title: Martin Petrek: Innovator in Electron Backscatter Diffraction

Introduction

Martin Petrek is a notable inventor based in Brno, Czech Republic. He has made significant contributions to the field of electron backscatter diffraction, particularly through his innovative methods and apparatus for sample characterization. His work has implications for various scientific and industrial applications.

Latest Patents

Martin Petrek holds a patent for "Methods and apparatus for electron backscatter diffraction sample characterisation." This patent describes a method of analyzing a sample imaged by electron backscatter diffraction. The method involves identifying a plurality of Kikuchi bands in an electron backscatter diffraction image of a position on the sample. For each identified Kikuchi band, a respective vector representation is formed based on an estimate of the position on the sample. The configuration of the sample is determined by identifying a particular set of expected vector representations that match the vector representations of the identified Kikuchi bands.

Career Highlights

Throughout his career, Martin Petrek has worked with prominent companies in the field. He has been associated with FEI Company and VG Systems Limited, where he has applied his expertise in electron backscatter diffraction and contributed to advancements in the technology.

Collaborations

Martin has collaborated with notable individuals in his field, including Austin Penrose Day and Christopher James Stephens. These collaborations have further enriched his work and expanded the impact of his innovations.

Conclusion

Martin Petrek is a distinguished inventor whose work in electron backscatter diffraction has paved the way for advancements in sample characterization. His contributions continue to influence the scientific community and industry practices.