Company Filing History:
Years Active: 2005-2006
Title: Martin D. Leibowitz: Innovator in Optical Imaging and Fault Localization
Introduction
Martin D. Leibowitz is a notable inventor based in Fremont, CA (US). He has made significant contributions to the fields of optical imaging and fault localization, holding a total of 2 patents. His work focuses on enhancing the accuracy and efficiency of imaging systems and fault detection methods.
Latest Patents
Leibowitz's latest patents include the "PICA System Detector Calibration" and "Spatial and Temporal Selective Laser Assisted Fault Localization." The PICA System Detector Calibration patent describes methods, apparatus, and data structures that correct PICA image data. This method involves acquiring optical image data and matching it with PICA image data to calculate coefficients that define the relationship between the two. These coefficients allow for corrections to be applied to the observed positions of detected photons, enhancing the accuracy of the imaging process.
The Spatial and Temporal Selective Laser Assisted Fault Localization patent presents a method and apparatus for laser-assisted fault mapping. This innovative approach synchronizes laser control with a tester unit, enabling the localization of defects in devices under dynamic stimulation. The method includes laser-assisted pseudo-static fault mapping and dynamic soft error mapping, which helps identify sensitive areas in a device based on performance criteria.
Career Highlights
Martin D. Leibowitz has built a successful career at Credence Systems Corporation, where he has applied his expertise in optical imaging and fault localization. His innovative contributions have significantly advanced the capabilities of imaging systems and fault detection technologies.
Collaborations
Leibowitz has collaborated with talented individuals such as Philippe Perdu and Romain Desplats, further enhancing the impact of his work in the field.
Conclusion
Martin D. Leibowitz is a distinguished inventor whose work in optical imaging and fault localization has led to significant advancements in technology. His patents reflect a commitment to innovation and excellence in his field.