This inventor holds 1 USPTO granted patent. Top assignee: Fei Comapny. Active years: 2025.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2025
Title: Martin Čechmánek: Innovator in Sample Handling Technology
Introduction
Martin Čechmánek is a notable inventor based in Rovečné, Czech Republic. He has made significant contributions to the field of charged particle microscopy through his innovative patent. His work focuses on improving the handling and storage of samples used in advanced microscopy techniques.
Latest Patents
Martin Čechmánek holds a patent for a "System and method for handling samples for study in a charged particle apparatus, such as a transmission electron microscope." This invention relates to a sample handling and storage system designed for cryogenic samples. The system includes a storage apparatus for multiple samples and a Charged Particle Apparatus (CPA), such as a cryo-TEM, located remotely from the storage apparatus. A transfer device is also included, which connects to both the storage apparatus and the CPA, facilitating the acquisition and transfer of samples.
Career Highlights
Martin is currently employed at FEI Company, where he continues to develop innovative solutions in the field of microscopy. His work has been instrumental in advancing the capabilities of charged particle microscopy, particularly in the handling of cryogenic samples.
Collaborations
Throughout his career, Martin has collaborated with talented individuals such as Jiří Benda and Vojtěch Doležal. These collaborations have contributed to the success of his projects and the advancement of technology in their field.
Conclusion
Martin Čechmánek is a distinguished inventor whose work in sample handling technology has made a significant impact on the field of charged particle microscopy. His innovative solutions continue to enhance the capabilities of microscopy techniques, paving the way for future advancements.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
