Wädenswil, Switzerland

Markus Wettstein

This inventor holds 3 USPTO granted patents and 1 published patent application. Top assignee: Hexagon Technology Center Gmbh. Active years: 2024-2025.

USPTO Granted Patents = 3 

% Patents Active = 100.0

Average Co-Inventor Count = 10.0

ph-index = 1


Company Filing History:


Years Active: 2024-2025

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3 patents (USPTO):Explore Patents

Title: Innovations of Markus Wettstein

Introduction

Markus Wettstein is a notable inventor based in Wädenswil, Switzerland. He has made significant contributions to the field of measurement technology, holding a total of 3 patents. His work focuses on developing advanced measuring systems that enhance the accuracy and efficiency of surface measurements.

Latest Patents

One of his latest patents is a measuring system designed for measuring the surface of an object or the skin of a person. This innovative system includes a capture device equipped with a set of illumination elements for illuminating the object and a set of cameras for capturing images. The controlling and processing unit of the system features data acquisition functionality, which provides surface data by activating the illumination elements and capturing images of the object. Additionally, it includes a 3D-modelling functionality that processes the surface data to create a 3D model of the object.

Career Highlights

Markus Wettstein is currently associated with Hexagon Technology Center GmbH, where he continues to push the boundaries of measurement technology. His expertise and innovative approach have positioned him as a key figure in his field.

Collaborations

Throughout his career, Markus has collaborated with talented professionals, including Stefan Geissbühler and Burkhard Böckem. These collaborations have further enriched his work and contributed to the development of cutting-edge technologies.

Conclusion

Markus Wettstein's contributions to measurement technology through his patents and collaborations highlight his role as an influential inventor. His innovative systems are paving the way for advancements in accurate surface measurement.

Profile summary based on public USPTO records.
Please report any incorrect information to [email protected]
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