The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 18, 2025
Filed:
Aug. 04, 2023
Hexagon Technology Center Gmbh, Heerbrugg, CH;
Gemma Taverni, Zürich, CH;
Hakki Karaman, Uster, CH;
Stefan Geissbühler, Langenthal, CH;
Simon Mark, Thal, CH;
Zheng Yang, Friedrichshafen, DE;
Burkhard Böckem, Jonen AG, CH;
Lukas Buchmann, Zürich, CH;
Sandra Tobler, Berneck, CH;
Jan Glückert, Lindau, DE;
Markus Wettstein, Wädenswil, CH;
HEXAGON TECHNOLOGY CENTER GMBH, Heerbrugg, CH;
Abstract
A measuring system for measuring an object, the measuring system comprising a capture device comprising a set of illumination elements for illuminating the object and a set of cameras for capturing an image of the object, and a controlling and processing unit. The controlling and processing unit comprises at least a data acquisition functionality which is configured to provide surface data by activating at least a part of the set of illumination elements for illuminating the object with measuring light and capturing at least one image by detecting measuring light reflected at the object by means of at least a part of the set of cameras and a 3D-modelling functionality which is configured to provide a 3D model of the object by processing the surface data.